X-Ray Diffractometer
Source: Kratos Analytical
The HPD-6000 high performance X-Ray Diffractometer is designed as a high-power parallel beam system
The HPD-6000 high performance X-Ray Diffractometer is designed as a high-power parallel beam system. Its large radius accepts a parallel beam polycapillary optic, which, in conjunction with a secondary collimator and monochromater, generates an extremely high intensity x-ray beam for general purpose analysis. In addition to the traditional parallel beam measurements of thin films, stress, and texture, the device also provides performance for phase analysis, non-ambient analysis, crystallography, and Rietveld.
Kratos Analytical, 100 Red Schoolhouse Road, A6, Chestnut Ridge, NY 10977. Tel: 914-426-6700; Fax: 914-426-6192.
This website uses cookies to ensure you get the best experience on our website. Learn more