SEMTech Solutions opens new FE-SEM services laboratory

North Billerica, MA - The laboratory is equipped with two FE-SEMs. The first FE-SEM will be primarily used for its analytical capabilities that include an Energy Dispersive Spectrometer and a Back Scattered Electron detector, as well as providing Secondary Electron Imaging. The second FE-SEM, a 3-D metrology system from Elionix in Japan, can measure surface height roughness profiles ranging from 1 nm to several hundred microns. The Elionix system is targeted at metallurgical companies where an AFM has trouble measuring large surface roughness height deviations or wide lateral measurement fields.

"The benefits of our SEM services laboratory will be to provide companies with a cost effective solution," states Gerry O'Loughlin, SEMTech Solutions president. "By being able to tap into Dr. Dobi's vast knowledge and experience, customers will be getting additional outside consultation in terms of best SEM practices."

SOURCE: SEMTech Solutions