Multi-Wavelength Ellipsometer
Source: J.A. Woollam Co.
This in situ multi-wavelength ellipsometer offers real-time measurement or control of
This in situ multi-wavelength ellipsometer offers real-time measurement or control of thin film thickness, composition and microstructure. It also provides atom layer thickness control with fast data acquisition and analysis. It has 44 wavelengths from 410 750nm that is measured simultaneously in 40 milliseconds, thus offering an acquisition time of less than 1 millisecond per wavelength. This system includes all necessary equipment from mounting hardware to a personal computer system. This system also has user-friendly software that can be customized to meet specific needs.
J.A. Woollam Co., Inc., 645 M Street, Suite 102 Lincoln, NE 68508 Phone: (402) 477-7501 Fax: 402-477-8214
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