Microscope System

The Momentµm FTIR Microscope System produces high-quality spectra with the combination of microscope features and a narrow-band MCT detector. The system includes an optical design which provides sensitivity and spatial resolution.

Reflachromat optics provide focus compensation and the flexibility for a range of microscopy techniques. The optical design allows for simultaneous sample viewing during IR data collection.

Video capture allows multi-user sample viewing and photo-documentation of the sample. The automation features and the flexibility of the software speed microscope analysis and streamline testing procedures.

Options include dual detectors, rotatable grazing angle and STR objectives, and camera packages.

The product can handle contaminants, multi-layered samples, forensic evidence, and silicon wafer analysis.

Mattson Instruments, 1001 Fourier Dr., Madison, WI 53717. Tel: 800-423-6641; Fax: 608-831-2093.