Large Chamber ESEM and Upgraded SEM Product Line

This company has upgraded its Philips' XL line of Scanning Electron Microscopes (SEMs), and extended it with the XL40 ESEM, which is designed to handle large samples.

The new XL40 ESEM features a large chamber, a 150-mm stage, and full ESEM capability, allowing users to analyze failures in larger samples. The system is also the basis of the Mineral Liberation Analyzer, which delivers accurate mineral identification and liberation analysis statistics to assist in ore source evaluation, mineral process circuit design, and plant optimization.

In the remainder of this line, the technical specifications of the series columns, frame-stores, and monitors have all been enhanced, along with mechanical subsystems like the vibration isolation system. The line has also been given a new modern design.

The line operates under Windows NT operating system. With a choice of electron sources, eucentric stages, vacuum systems, and numerous accessory ports, the SEMs can be configured to specific customer requirements. The Hexalens column is said to provide high quality low-kV imaging, atomic number contrast, and analytical flexibility. The SEMs have optimized low-voltage performance for true surface analysis and high resolution BD/DF STEM.

FEI Company, 7451 NW Evergreen Parkway, Hillsboro, OR 97124-5830. Tel: 503-640-7500. Fax: 503-640-7509.