News | February 26, 2007

Integrated Technology Corporation Introduces Probilt PB6800

Integrated Technology Corporation (ITC) has introduced a solution for testing 300 mm probe card arrays by expanding the capabilities of its popular PB6500 probe card analyzer. PB6800 analyzers have been delivered and successfully installed at Probe Card Manufacturers in Korea and the USA. The new PB6800 has a 12" diameter tungsten carbide measurement chuck with dual camera's and extended stage travel that allow probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface. Probilt's accurate measurement system can be expanded up to 12,000 test channels with optional software selected relay or FET drive available on all 12,000 channels. Combined with the high chuck lift capability of 400lb (180Kg) this makes it the ideal analyzer for all probe card technologies, including those being used to test the largest memory arrays on the newest test platforms. Probilt systems have long been recognized as the analyzer of choice for vertical probe card manufacturers.

The complete line of ITC Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured.

SOURCE: Integrated Technology Corporation (ITC)