Product/Service

Environmental Scanning Electron Microscope

Source: FEI Company
Environmental Scanning Electron Microscope
The XL30 ESEM Series is an environmental scanning electron microscope available with field emission, LaB6, tungsten cathodes and
The XL30 ESEM Series is an environmental scanning electron microscope available with field emission, LaB6, tungsten cathodes and three modes of operation: high vacuum, low vacuum, and environmental (wet) modes. This microscope provides secondary and backscattered electron detectors for all three operating modes, in addition to offering secondary resolution of at least 3.5 nm.

With this system, specimens can be imaged wet, allowing them to be viewed in their natural states and to be cycled through hydration/dehydration and operator-specified relative humidity levels. This microscope is suitable for imaging uncoated and non-conductive samples at low and high kV in all operating modes.

FEI Company, 7451 N.E. Evergreen Pkwy., Hillsboro, OR 97124 Phone: (503) 640-7500 Fax: (5030 640-7509