Field Emission Electron Microscope
Source: Jeol Usa Inc.
The JEM-2010F Field Emission Electron Microscope from JEOL is a multipurpose high resolution analytical electron microscope
The JEM-2010F Field Emission Electron Microscope from JEOL is a multipurpose high resolution analytical electron microscope with high-resolution image observation, microarea X-ray analysis, and a wide range of capabilities.
The JEM-2010F has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM. The JEM-2010F can be equipped with optional energy dispersive X-ray spectrometers (EDS), a parallel detection electron energy spectrometer (PEELS), a scanning image observation device (ASID), and TV units.
JEOL USA, 11 Dearborn Rd., Peabody, MA 01960. Tel: 978-535-5900; Fax: 978-535-2205
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