Product/Service

LEO 1530VP Variable Pressure Scanning Electron Microscope

Source: LEO Electron Microscopy Inc.
LEO 1530VP Variable Pressure Scanning Electron Microscope
The LEO 1530VP represents the absolute pinnacle of high-performance and flexibility in specimen handling
The LEO 1530VP represents the absolute pinnacle of high-performance and flexibility in specimen handling. With the unique combination of GEMINI ultra-performance electron optics and LEO's Variable Pressure technology, the LEO 1530VP delivers truly outstanding capabilities in a range of applications.

The chamber pressure can be set to any value in the pressure range to suit the specimen and optimum secondary electron imaging is always available. In-lens detection at high vacuum, patented VPSE detection in VP mode.

With the ability also to allow X-ray analysis on completely insulating specimens, the LEO 1530VP is perfect in applications such as semiconductor FA, life science, geology, archaeology, composite materials and many more.

LEO Electron Microscopy Inc., One Zeiss Drive, Thornwood, NY 10594. Tel: 914-747-7700; Fax: 914-681-7443.