Product/Service

Dual Beam, 115-380 nm, Vacuum Ultraviolet Test Station

Source: McPherson, Inc.
Test absorbance, transmittance and reflectance (at variable angles) in the 115 - 380 nm wavelength region! The McPherson VUVaS series includes the first vacuum compatible double beam system which simultaneously collects sample and
Test absorbance, transmittance and reflectance (at variable angles) in the 115 - 380 nm wavelength region! The McPherson VUVaS series includes the first vacuum compatible double beam system which simultaneously collects sample and reference spectra. Individual spectral or ratio results are displayed during acquisition.

Beam collimation delivers a consistent spot size to the sample guaranteeing best results. Standard units accept either (5) 1 inch diameter samples or (3) 2 x 2 inch samples in easy to position sample holders. Six inch diameter wafers and other samples (crystalline cubes, etc.) can be mounted in custom mounts. The variable and selectable sample/detector position permits analysis of irregular or diffractive samples. Detector angles can be set from 10 - 180° allowing users to perform scatter, reflectance or transmittance measurements. Sample angles can be set from 0 - 89°.

Interactive computer control of spectrometer wavelength scans and data acquisition makes this a unique and easy to use system for QC/QA and analytical research applications.

McPherson, Inc., 7A Stuart Road, Chelmsford, MA 01824. Tel: 978-256-4512; Fax: 978-256-8625.